What problem does it solve?
Hardware security testers need to know whether an embedded target's on-chip debug port is exposed, locked, or fused off, but manually driving J-Link sessions and interpreting DPIDR/IDCODE responses is slow and error-prone.
Core Features & Use Cases
- Automated interface sweep: Sweeps SWD then JTAG across multiple clock speeds (4000/1000/100 kHz) with a JTAG chain auto-scan fallback.
- Three-state classification: Classifies targets as OPEN (full halt and memory access), LOCKED (readout protection like STM32 RDP, NXP CRP, Nordic APPROTECT), or DEAD (no response).
- Vendor identification and evidence capture: Decodes DPIDR/IDCODE JEP106 designer fields to identify silicon vendors and saves per-attempt JLinkExe logs for pentest writeups.
- Use Case: During an IoT pentest, run the probe against an unknown STM32-based board to confirm the debug port responds, capture the all-0xFF flash reads proving RDP is engaged, and document the finding under CWE-1191.
Quick Start
Ask the assistant to test the connected target for exposed JTAG and SWD debug interfaces and save the evidence logs to a timestamped directory.