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scientific-materials-characterization

Integrate XRD, AFM, electrical, and optical data to quantify structure-property relationships in thin films.

3|1|Updated Feb 11, 2026
Search Tags:#xrd#psp#data-fusion#materials-science#afm#structure-property#thin-film
One-click install
npx skills add https://github.com/nahisaho/satori --skill scientific-materials-characterization
Or copy as Structured Prompt for Agent▼
Please help me install this Agent Skill.
Skill: scientific-materials-characterization
Source: https://github.com/nahisaho/satori/tree/main/src/.github/skills/scientific-materials-characterization
Command: npx skills add https://github.com/nahisaho/satori --skill scientific-materials-characterization

SYSTEM DOCUMENTATION & REQUIREMENTS

What problem does it solve?

This skill enables systematic structural characterization of thin films by integrating measurements such as XRD, AFM, electrical, and optical data into a PSP (Process-Structure-Property) framework to quantify structure–property relationships.

Core Features & Use Cases

  • XRD analysis & PSP mapping: Integrates Scherrer crystallite size and Williamson–Hall analysis to derive crystallite size, strain, and orientation information.
  • Multi-technique data fusion: Combines XRD, AFM, electrical, and optical measurements to derive PSP-level insights.
  • Real-world use case: Correlate deposition conditions with film structure and properties to optimize optical and electrical performance.

Quick Start

Load your thin-film measurement dataset and run the PSP mapping to derive structure-property relationships.

Frequently Asked Questions about scientific-materials-characterization

High-intent search queries and answers about installing and using this skill.

FAQPage Schema
How do I integrate XRD and AFM data to analyze thin-film structure-property relationships?▼

To analyze thin-film structure-property relationships, this skill integrates XRD and AFM measurements within a PSP framework to map processing conditions to material properties and derive robust metrics.

What is a PSP framework for materials characterization and when do I need it?▼

A PSP framework for materials characterization maps the correlation between processing conditions, structure, and properties. You need it to systematically quantify structure-property metrics in thin films.

Can I extract crystallite size and strain from XRD data for thin films?▼

Yes, you can extract crystallite size and strain from XRD data for thin films. The skill applies Scherrer and Williamson–Hall analysis to derive crystallite size, strain, and orientation information.

How do I correlate deposition conditions with optical and electrical performance in thin films?▼

To correlate deposition conditions with optical and electrical performance, multi-technique data fusion combines electrical and optical measurements with structural data to produce PSP-level insights.

Do I need a specific data fusion routine to map processing conditions to material properties?▼

Yes, mapping processing conditions to material properties requires data fusion routines and a PSP framework. This skill needs these to integrate XRD, AFM, conductivity, and spectroscopic data.

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