scientific-materials-characterization
CommunityPSP-driven structure analysis for thin films.
Authornahisaho
Version1.0.0
Installs0
System Documentation
What problem does it solve?
This skill enables systematic structural characterization of thin films by integrating measurements such as XRD, AFM, electrical, and optical data into a PSP (Process-Structure-Property) framework to quantify structure–property relationships.
Core Features & Use Cases
- XRD analysis & PSP mapping: Integrates Scherrer crystallite size and Williamson–Hall analysis to derive crystallite size, strain, and orientation information.
- Multi-technique data fusion: Combines XRD, AFM, electrical, and optical measurements to derive PSP-level insights.
- Real-world use case: Correlate deposition conditions with film structure and properties to optimize optical and electrical performance.
Quick Start
Load your thin-film measurement dataset and run the PSP mapping to derive structure-property relationships.
Dependency Matrix
Required Modules
None requiredComponents
Standard packageđź’» Claude Code Installation
Recommended: Let Claude install automatically. Simply copy and paste the text below to Claude Code.
Please help me install this Skill: Name: scientific-materials-characterization Download link: https://github.com/nahisaho/satori/archive/main.zip#scientific-materials-characterization Please download this .zip file, extract it, and install it in the .claude/skills/ directory.
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